Invention Grant
- Patent Title: Method of fabricating semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US12883526Application Date: 2010-09-16
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Publication No.: US08283788B2Publication Date: 2012-10-09
- Inventor: Hongyong Zhang
- Applicant: Hongyong Zhang
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP7-332629 19951127
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
Method of fabricating thin-film transistors in which contact with connecting electrodes becomes reliable. When contact holes are formed, the bottom insulating layer is subjected to a wet etching process, thus producing undercuttings inside the contact holes. In order to remove the undercuttings, a light etching process is carried out to widen the contact holes. Thus, tapering section are obtained, and the covering of connection wiring is improved.
Public/Granted literature
- US08154136B2 Method of fabricating semiconductor device Public/Granted day:2012-04-10
Information query
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