Invention Grant
- Patent Title: Semiconductor storage device and reading method thereof
- Patent Title (中): 半导体存储装置及其读取方法
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Application No.: US12978878Application Date: 2010-12-27
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Publication No.: US08284605B2Publication Date: 2012-10-09
- Inventor: Rieko Tanaka , Makoto Iwai
- Applicant: Rieko Tanaka , Makoto Iwai
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-007121 20100115
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
An embodiment of the invention provides a semiconductor storage device including a NAND string, a SEN node, and a capacitor. The NAND string includes plural series-connected memory cells, and one end of the NAND string is connected to a bit line while the other end is connected to a common source line. The SEN node is configured to be able to be electrically connected to a voltage source and the bit line. In the capacitor, one end is connected to the SEN node while the other end is connected to a CLK node to which a voltage within a predetermined range is applied. A discharge rate of the SEN node is enhanced by decreasing a capacitance during discharge of the SEN node only when a selected memory cell selected from the plural memory cells is an on-cell.
Public/Granted literature
- US20110176366A1 SEMICONDUCTOR STORAGE DEVICE AND READING METHOD THEREOF Public/Granted day:2011-07-21
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