Invention Grant
- Patent Title: Verifying and programming method of nonvolatile memory device
- Patent Title (中): 非易失性存储器件的验证和编程方法
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Application No.: US12826283Application Date: 2010-06-29
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Publication No.: US08284611B2Publication Date: 2012-10-09
- Inventor: Eun Joung Lee
- Applicant: Eun Joung Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0059168 20090630
- Main IPC: G11C16/06
- IPC: G11C16/06

Abstract:
A method of operating a nonvolatile memory device includes precharging bit lines coupled to strings, supplying a first verification voltage to a selected word line and supplying a pass voltage to word lines other than the selected word line, supplying a first sense pulse to switching elements coupled between the bit lines and sense nodes and detecting memory cells, each having a threshold voltage higher than the first verification voltage, supplying a second verification voltage higher than the first verification voltage to the selected word line and supplying the pass voltage to the word lines other than the selected word line, and supplying a second sense pulse to the switching elements and detecting memory cells, each having a threshold voltage higher than the second verification voltage.
Public/Granted literature
- US20100329031A1 METHOD OF OPERATING NONVOLATILE MEMORY DEVICE Public/Granted day:2010-12-30
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