Invention Grant
- Patent Title: Multiview x-ray inspection system
- Patent Title (中): 多视角x射线检查系统
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Application No.: US12588705Application Date: 2009-10-26
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Publication No.: US08284896B2Publication Date: 2012-10-09
- Inventor: Satpal Singh
- Applicant: Satpal Singh
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01T1/00 ; H05G1/08

Abstract:
A multiview x-ray scanning system for inspecting the 3D volume of an object has been presented. The method uses multiple x-ray sources and multiple x-ray beams. The object to be inspected is interposed in the trajectory of these beams and moved relative to these beams. The x-ray beams after passing through the object are detected by detectors that are interleaved to realize a compact design. In order that the interleaved detectors do not intersect, the location of detectors and sources is adjusted. Further, the design of detectors is such that they can be placed in close proximity to each other in order to realize a small footprint scanner having a high resolution.
Public/Granted literature
- US20110096903A1 Multiview x-ray inspection system Public/Granted day:2011-04-28
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