Invention Grant
US08289017B2 Method and device for analysing a magnetic material, and analyser including the device
有权
用于分析磁性材料的方法和装置,以及包括该装置的分析仪
- Patent Title: Method and device for analysing a magnetic material, and analyser including the device
- Patent Title (中): 用于分析磁性材料的方法和装置,以及包括该装置的分析仪
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Application No.: US12676405Application Date: 2008-09-05
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Publication No.: US08289017B2Publication Date: 2012-10-16
- Inventor: Luc Lenglet
- Applicant: Luc Lenglet
- Applicant Address: CY
- Assignee: Magnisense Technology Limited
- Current Assignee: Magnisense Technology Limited
- Current Assignee Address: CY
- Agency: Cantor Colburn LLP
- Priority: FR0757437 20070907
- International Application: PCT/IB2008/055606 WO 20080905
- International Announcement: WO2009/031129 WO 20090312
- Main IPC: G01N27/72
- IPC: G01N27/72

Abstract:
Disclosed is a method of analysing a magnetic material which includes the construction of a signature S(H) of the magnetic material formed from at least two points S(H)P, this construction including obtaining the value of each point S(H)P by measuring, over each period fraction, the amplitude and possibly the phase of a harmonic of the magnetic field induced in the magnetic material, said amplitude and phase being obtained in response only to an excitation during this period fraction, the harmonic having a frequency nfH, where n is a non-zero positive integer; and the identification and/or the determination of the mass of the magnetic material from several points of the constructed signature S(H).
Public/Granted literature
- US20100301850A1 METHOD AND DEVICE FOR ANALYSING A MAGNETIC MATERIAL, AND ANALYSER INCLUDING THE DEVICE Public/Granted day:2010-12-02
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