Invention Grant
- Patent Title: Application of wideband sampling for arc detection with a probabilistic model for quantitatively measuring arc events
- Patent Title (中): 用定量测量电弧事件的概率模型应用宽带采样电弧检测
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Application No.: US12175867Application Date: 2008-07-18
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Publication No.: US08289029B2Publication Date: 2012-10-16
- Inventor: David J. Coumou
- Applicant: David J. Coumou
- Applicant Address: US MA Andover
- Assignee: MKS Instruments, Inc.
- Current Assignee: MKS Instruments, Inc.
- Current Assignee Address: US MA Andover
- Agency: Harness, Dickey & Pierce, P.L.C.
- Main IPC: H01H9/50
- IPC: H01H9/50

Abstract:
An arc detection system for a plasma generation system includes a radio frequency (RF) sensor that generates first and second signals based on a respective electrical properties of (RF) power that is in communication with a plasma chamber. A correlation module generates an arc detect signal based on the first and second signals. The arc detect signal indicates whether an arc is occurring in the plasma chamber and is employed to vary an aspect of the RF power to extinguish the arc.
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