Invention Grant
- Patent Title: Distortion identification apparatus, test system, recording medium and distortion identification method
- Patent Title (中): 失真识别装置,测试系统,记录介质和失真识别方法
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Application No.: US12580114Application Date: 2009-10-15
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Publication No.: US08290032B2Publication Date: 2012-10-16
- Inventor: Koji Asami
- Applicant: Koji Asami
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Priority: JP2008-267911 20081016
- Main IPC: H04Q1/20
- IPC: H04Q1/20

Abstract:
Provided is a signal output control section that inputs to a digitizer a reference signal whose frequency changes at each prescribed measurement cycle; a data extracting section that extracts a number of pieces of data corresponding to an integer multiple of a period of the reference signal in each measurement cycle, from pieces of data of a reference digital signal output by the digitizer according to the reference signal that come after a prescribed wait interval has passed since an initiation timing of each measurement cycle; a distortion identifying section that calculates the non-linear distortion caused by the digitizer for each frequency of the reference signal, based on the data in each measurement cycle extracted by the data extracting section; and a distortion calculating section that calculates the non-linear distortion caused by the digitizer when the analog signal input to the digitizer has a frequency that differs from any of the plurality of frequencies at which the reference signal transitions, based on the non-linear distortion detected by the distortion identifying section for each frequency.
Public/Granted literature
- US20100309952A1 Distortion identification apparatus, test system, recording medium and distortion identification method Public/Granted day:2010-12-09
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