Invention Grant
US08291394B2 Method and apparatus for detecting transient faults via dynamic binary translation
有权
通过动态二进制翻译检测瞬态故障的方法和装置
- Patent Title: Method and apparatus for detecting transient faults via dynamic binary translation
- Patent Title (中): 通过动态二进制翻译检测瞬态故障的方法和装置
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Application No.: US13135712Application Date: 2011-07-13
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Publication No.: US08291394B2Publication Date: 2012-10-16
- Inventor: George A. Reis , Robert Cohn , Shubhendu S. Mukherjee
- Applicant: George A. Reis , Robert Cohn , Shubhendu S. Mukherjee
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agent L. Cho
- Main IPC: G06F9/45
- IPC: G06F9/45
Abstract:
A method for detecting transient fault includes translating binary code to an intermediate language code. An instruction of interest in the intermediate language code is identified. Reliability instructions are inserted in the intermediate language code to validate values from the instruction of interest. The intermediate language code is translated to binary code. Other embodiments are described and claimed.
Public/Granted literature
- US20110271262A1 Method and apparatus for detecting transient faults via dynamic binary translation Public/Granted day:2011-11-03
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