Invention Grant
- Patent Title: Multiple beam charged particle optical system
- Patent Title (中): 多光束带电粒子光学系统
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Application No.: US12885380Application Date: 2010-09-17
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Publication No.: US08294117B2Publication Date: 2012-10-23
- Inventor: Pieter Kruit , Aernout Christiaan Zonnevylle
- Applicant: Pieter Kruit , Aernout Christiaan Zonnevylle
- Applicant Address: NL Delft
- Assignee: Mapper Lithography IP B.V.
- Current Assignee: Mapper Lithography IP B.V.
- Current Assignee Address: NL Delft
- Agency: Blakely, Sokoloff, Taylor & Zafman
- Main IPC: G21K1/08
- IPC: G21K1/08

Abstract:
The invention relates to a multiple beam charged particle optical system comprising: a charged particle source for generating a plurality of charged particle beamlets, and charged particle optics for directing the charged particle beamlets from the charged particle source towards a target, wherein each charged particle beamlet defines a beamlet center line, said charged particle optics comprising one or more electrostatic lens arrays, each comprising two or more array electrodes for generating a plurality of electrostatic lenslets, wherein each lenslet is arranged for focusing a corresponding charged particle beamlet, and wherein each lenslet defines a lenslet optical axis, wherein at least one of said one or more electrostatic lens arrays comprises one or more off-axis electrostatic lenslets, wherein the beamlet center line of the corresponding charged particle beamlet passes through said off-axis electrostatic lenslet at a distance from its lenslet optical axis.
Public/Granted literature
- US20110068276A1 MULTIPLE BEAM CHARGED PARTICLE OPTICAL SYSTEM Public/Granted day:2011-03-24
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