Invention Grant
- Patent Title: Test system and method for analog-to-digital converter
- Patent Title (中): 模拟 - 数字转换器的测试系统和方法
-
Application No.: US13071138Application Date: 2011-03-24
-
Publication No.: US08294604B2Publication Date: 2012-10-23
- Inventor: Tsung-Yu Lai
- Applicant: Tsung-Yu Lai
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: Faraday Technology Corp.
- Current Assignee: Faraday Technology Corp.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: TW99110394A 20100402
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
Test system and method for analog-to-digital converter (ADC) based on a loopback architecture are provided to test an M-bit ADC. In the invention, an N-bit digital-to-analog converter (DAC) converts a digital input to a basic test signal, a segmentation circuit scales the basic test signal and superposes it with segmentation DC levels for providing corresponding segmented test signals, such that the ADC converts the segmented test signals to reflect result of testing. With the invention, practical loopback architecture of low-cost can be adopted for testing.
Public/Granted literature
- US20110241914A1 TEST SYSTEM AND METHOD FOR ANALOG-TO-DIGITAL CONVERTER Public/Granted day:2011-10-06
Information query