Invention Grant
- Patent Title: Measuring head system for a coordinate measuring machine and method for optically measuring of displacements of a probe element
- Patent Title (中): 用于坐标测量机的测量头系统和用于光学测量探针元件的位移的方法
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Application No.: US12741075Application Date: 2008-10-29
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Publication No.: US08294906B2Publication Date: 2012-10-23
- Inventor: Knut Siercks , Heinz Lippuner , Ursula Schwitter , Stefan Frei , Baptiste Wusk , Claus P. Keferstein
- Applicant: Knut Siercks , Heinz Lippuner , Ursula Schwitter , Stefan Frei , Baptiste Wusk , Claus P. Keferstein
- Applicant Address: CH Heerbrugg
- Assignee: Leica Geosystems AG
- Current Assignee: Leica Geosystems AG
- Current Assignee Address: CH Heerbrugg
- Agency: Maschoff Gilmore & Israelsen
- Priority: EP07119973 20071105
- International Application: PCT/EP2008/064642 WO 20081029
- International Announcement: WO2009/059916 WO 20090514
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
A measuring head system for a coordinate measuring machine, having a scanning element for contacting a measured object as a contacting part, which can be moved such that an object to be measured can be mechanically scanned using the scanning element. An optical sensor is fixed on the measuring head base. Means are provided to generate a projection on the sensor line using at least one radiation source. The means have at least one first mask element to generate a first partial projection on the sensor line such that said partial projection is optimized to determine an x displacement and a y displacement of the contacting part in relation to the measuring head base in the x direction or y direction. An analysis unit is configured to determine the x displacement and the y displacement from signals only generated by the one sensor line.
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