Invention Grant
US08296714B2 System and method for checking analog circuit with digital checker
有权
用数字检查器检查模拟电路的系统和方法
- Patent Title: System and method for checking analog circuit with digital checker
- Patent Title (中): 用数字检查器检查模拟电路的系统和方法
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Application No.: US12580717Application Date: 2009-10-16
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Publication No.: US08296714B2Publication Date: 2012-10-23
- Inventor: Guha Lakshmanan , Sudhind Dhamankar , Vipin Sharma , Sandeep Tare
- Applicant: Guha Lakshmanan , Sudhind Dhamankar , Vipin Sharma , Sandeep Tare
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Ronald O. Neerings; Wade James Brady, III; Frederick J. Telecky, Jr.
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/22 ; G01R31/02
Abstract:
Aspects of the present invention provide a system and method for checking a portion of an analog circuit using a digital checker. The method includes establishing a target in the analog circuit, creating an analog target dummy for the target, creating a digital target dummy, binding the digital target dummy to the analog target dummy, and checking a value of the digital target dummy with a digital checker.
Public/Granted literature
- US20100097072A1 SYSTEM AND METHOD FOR CHECKING ANALOG CIRCUIT WITH DIGITAL CHECKER Public/Granted day:2010-04-22
Information query
