Invention Grant
- Patent Title: Prototyping station for atomic force microscope-assisted deposition of nanostructures
- Patent Title (中): 原子力显微镜辅助沉积纳米结构原型台
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Application No.: US12383467Application Date: 2009-03-23
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Publication No.: US08296859B2Publication Date: 2012-10-23
- Inventor: James F. Mack , Neil Dasgupta , Timothy P. Holme , Friedrich B. Prinz , Andrei Iancu , Wonyoung Lee
- Applicant: James F. Mack , Neil Dasgupta , Timothy P. Holme , Friedrich B. Prinz , Andrei Iancu , Wonyoung Lee
- Applicant Address: US CA Palo Alto JP Tokyo
- Assignee: The Board of Trustees of the Leland Stanford Junior University,Honda Motor Co., Ltd
- Current Assignee: The Board of Trustees of the Leland Stanford Junior University,Honda Motor Co., Ltd
- Current Assignee Address: US CA Palo Alto JP Tokyo
- Agency: Lumen Patent Firm
- Main IPC: G01N13/10
- IPC: G01N13/10

Abstract:
A localized nanostructure growth apparatus that has a partitioned chamber is provided, where a first partition includes a scanning probe microscope (SPM) and a second partition includes an atomic layer deposition (ALD) chamber, where the first partition is hermetically isolated from the second partition, and at least one SPM probe tip of the SPM is disposed proximal to a sample in the ALD chamber. According to the invention, the hermetic isolation between the chambers prevents precursor vapor from damaging critical microscope components and ensuring that contaminants in the ALD chamber can be minimized.
Public/Granted literature
- US20090241232A1 Prototyping station for atomic force microscope-assisted deposition of nanostructures Public/Granted day:2009-09-24
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