The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a three wave interference pattern and a single-arm interferometer Specifically the invention comprises a radiation source operable to emit radiation connected to an apparatus for separating incident and reflected waves; the apparatus for separating incident and reflected waves having an output arm adjacent to a first end of the waveguide; the apparatus for separating incident and reflected waves connected to a detector; a collimating apparatus positioned at a second end of the waveguide; and a reflecting apparatus positioned at a balanced distance from the collimating apparatus operable to reflect a test emission from the radiation source back through the collimating apparatus, the waveguide, and the apparatus for separating incident and reflected waves thereby generating an interference pattern that is recorded by the detector.