Invention Grant
- Patent Title: Device and method for testing a device
- Patent Title (中): 用于测试设备的设备和方法
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Application No.: US12281927Application Date: 2006-03-13
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Publication No.: US08302065B2Publication Date: 2012-10-30
- Inventor: Oshri Shomrony , Aner Kantor , Lior Moheban , Ytzhak Rosenthal
- Applicant: Oshri Shomrony , Aner Kantor , Lior Moheban , Ytzhak Rosenthal
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2006/050780 WO 20060313
- International Announcement: WO2007/105036 WO 20070920
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A device that includes a core and a wrapper. The wrapper includes at least one shared wrapper cell that is shared by a group of core pins that belong to a single clock domain. A method for designing a wrapper. The method includes receiving design information representative of a design of a core, locating a group of mutually independent core pins that belong to a single clock domain; and designing a shared wrapped cell that is shared by the group of core pins.
Public/Granted literature
- US20090206866A1 DEVICE AND METHOD FOR TESTING A DEVICE Public/Granted day:2009-08-20
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