Invention Grant
US08302195B2 Sample analyzer, sample analyzing method, and computer program product
有权
样品分析仪,样品分析方法和计算机程序产品
- Patent Title: Sample analyzer, sample analyzing method, and computer program product
- Patent Title (中): 样品分析仪,样品分析方法和计算机程序产品
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Application No.: US12626233Application Date: 2009-11-25
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Publication No.: US08302195B2Publication Date: 2012-10-30
- Inventor: Yoshiyuki Kawamura
- Applicant: Yoshiyuki Kawamura
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2008-310428 20081205
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30

Abstract:
A sample analyzer comprising: a measuring unit for measuring a sample and outputting measurement data; and a measurement controller configured for carrying out operations comprising: obtaining analysis results of measurement data output from the measuring unit; detecting a malicious program; and restricting the output of the obtained analysis results when a malicious program has been detected, is disclosed. A sample analyzing method and a computer program product are also disclosed.
Public/Granted literature
- US20100146625A1 SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND COMPUTER PROGRAM PRODUCT Public/Granted day:2010-06-10
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