Invention Grant
US08302456B2 Active damping of high speed scanning probe microscope components 有权
高速扫描探针显微镜组件的主动阻尼

Active damping of high speed scanning probe microscope components
Abstract:
A technique for actively damping internal vibrations in a scanning probe microscope is disclosed. The excitation of various mechanical movements, including resonances, in the mechanical assembly of an SPM can adversely effect its performance, especially for high speed applications. An actuator is used to compensate for the movements. The actuator may operate in only the z direction, or may operate in other directions. The actuator(s) may be located at positions of antinodes.
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