Invention Grant
- Patent Title: Particulate matter detection device
- Patent Title (中): 颗粒物检测装置
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Application No.: US12701774Application Date: 2010-02-08
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Publication No.: US08305087B2Publication Date: 2012-11-06
- Inventor: Takashi Egami , Takeshi Sakuma , Masahiro Tokuda , Atsuo Kondo
- Applicant: Takashi Egami , Takeshi Sakuma , Masahiro Tokuda , Atsuo Kondo
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown
- Priority: JP2009-058856 20090312
- Main IPC: G01N27/62
- IPC: G01N27/62 ; G01N27/00 ; G01F13/00

Abstract:
A particulate matter detection device including a first electrode having one surface covered with a dielectric material; a second electrode which is disposed on the side of the one surface of the first electrode via a space where a gas including particulate matter flows and which performs one or both of the formation of a discharge and an electric field by a voltage applied between the first electrode and the second electrode; a pair of measurement electrodes disposed on the surface of the dielectric material so as to face each other; and a protective film disposed on the surfaces of the pair of measurement electrodes and having a volume resistivity of 10 Ωcm to 1012 Ωcm, where the variate of the electric properties between the pair of measurement electrodes is measured, and the amount of the collected particulate matter can be obtained.
Public/Granted literature
- US20100229629A1 PARTICULATE MATTER DETECTION DEVICE Public/Granted day:2010-09-16
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