Invention Grant
US08305104B2 Testing and sorting system having a linear track and method of using the same
失效
具有线性轨迹的测试和分类系统及其使用方法
- Patent Title: Testing and sorting system having a linear track and method of using the same
- Patent Title (中): 具有线性轨迹的测试和分类系统及其使用方法
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Application No.: US12732002Application Date: 2010-03-25
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Publication No.: US08305104B2Publication Date: 2012-11-06
- Inventor: Douglas Garcia , Vernon Cooke , Spencer Barrett
- Applicant: Douglas Garcia , Vernon Cooke , Spencer Barrett
- Applicant Address: US OR Portland
- Assignee: Electro Scientific Industries, Inc.
- Current Assignee: Electro Scientific Industries, Inc.
- Current Assignee Address: US OR Portland
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
An improved method and apparatus for testing and sorting electro-optic devices by both electrical and optical properties at high speed is disclosed. Electro-optic devices, in particular light emitting diodes, are singulated by a singulation device and transferred to a linear track where they are tested for electrical and optical properties. The devices are then sorted into a large number of different bins depending upon the tested properties.
Public/Granted literature
- US20100256802A1 SYSTEM AND METHOD FOR IMPROVED TESTING OF ELECTRONIC DEVICES Public/Granted day:2010-10-07
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