Invention Grant
- Patent Title: Simulated mounting structure for testing electrical devices
- Patent Title (中): 用于测试电气设备的模拟安装结构
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Application No.: US12292082Application Date: 2008-11-12
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Publication No.: US08305105B2Publication Date: 2012-11-06
- Inventor: Erik Vaaler , Amir Torkaman , George Panotopoulos
- Applicant: Erik Vaaler , Amir Torkaman , George Panotopoulos
- Applicant Address: VG Tortola
- Assignee: NovaSolar Holdings Limited
- Current Assignee: NovaSolar Holdings Limited
- Current Assignee Address: VG Tortola
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
A testing apparatus or test jig is configured to accept a electrical device for testing prior to final assembly. In one example, a pair of conductive conveying belts compliantly engage a partially assembled photovoltaic (PV) module by its sides, and electrodes engage orthogonal sides of the module. The test apparatus or jig can be use for a variety of electrical tests, and may, for example be connected to a high potential (HiPot) tester.
Public/Granted literature
- US20100117671A1 Simulated mounting structure for testing electrical devices Public/Granted day:2010-05-13
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