Invention Grant
US08305105B2 Simulated mounting structure for testing electrical devices 失效
用于测试电气设备的模拟安装结构

Simulated mounting structure for testing electrical devices
Abstract:
A testing apparatus or test jig is configured to accept a electrical device for testing prior to final assembly. In one example, a pair of conductive conveying belts compliantly engage a partially assembled photovoltaic (PV) module by its sides, and electrodes engage orthogonal sides of the module. The test apparatus or jig can be use for a variety of electrical tests, and may, for example be connected to a high potential (HiPot) tester.
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