Invention Grant
- Patent Title: Testing circuit board
- Patent Title (中): 测试电路板
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Application No.: US12755480Application Date: 2010-04-07
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Publication No.: US08305276B2Publication Date: 2012-11-06
- Inventor: Ying Yang , Yan-Feng Yang , Ling-Yu Huang , Long-Yong Liu , Guo-Min Luo
- Applicant: Ying Yang , Yan-Feng Yang , Ling-Yu Huang , Long-Yong Liu , Guo-Min Luo
- Applicant Address: CN ShenZhen, Guangdong Province HK Kowloon
- Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee Address: CN ShenZhen, Guangdong Province HK Kowloon
- Agency: Altis Law Group, Inc.
- Priority: CN200910311630 20091216
- Main IPC: G01R29/10
- IPC: G01R29/10

Abstract:
An exemplary testing circuit board is used for testing an antenna performance and includes a signal circuit layer, a base layer electrically connected to the signal circuit layer, and a test unit. The signal circuit layer can transmit test signals from the antenna. The base layer is fixed with the signal circuit layer and used as a ground section to shield the test signals. The test unit is electrically connected to the signal circuit layer and the base layer and includes a signal inception port. The signal inception port is positioned on the signal circuit layer and protrudes from the base layer, and the signal inception port is capable of receiving the test signals and transmitting the test signals to the signal circuit layer.
Public/Granted literature
- US20110140974A1 TESTING CIRCUIT BOARD Public/Granted day:2011-06-16
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