Invention Grant
- Patent Title: Image processing system and scanning electron microscope
- Patent Title (中): 图像处理系统和扫描电子显微镜
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Application No.: US12053287Application Date: 2008-03-21
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Publication No.: US08305435B2Publication Date: 2012-11-06
- Inventor: Yoshimichi Sato , Mitsuji Ikeda , Fumihiro Sasajima
- Applicant: Yoshimichi Sato , Mitsuji Ikeda , Fumihiro Sasajima
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2007-075124 20070322
- Main IPC: H04N7/18
- IPC: H04N7/18 ; H04N9/47 ; G01N23/00 ; G21K7/00 ; G06K9/62

Abstract:
The present invention achieves the process of easily registering a template which is prepared for a size change in pattern matching for specifying a measurement point, and high-speed pattern matching by which adequate position accuracy can be obtained in measurement. The present invention includes means for automatically calculating the size and position of a positioning template different from a measurement point itself when the measurement point is designated, to display a template having the calculated size and position. The present invention further includes means for performing pattern matching by using all or some of a plurality of divided templates and extracting templates having a similar positional relationship to the original positional relationship.
Public/Granted literature
- US20090295914A1 Image Processing System and Scanning Electron Microscope Public/Granted day:2009-12-03
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