Invention Grant
US08305542B2 Thin film transistor array substrate with improved test terminals
有权
具有改进测试端子的薄膜晶体管阵列基板
- Patent Title: Thin film transistor array substrate with improved test terminals
- Patent Title (中): 具有改进测试端子的薄膜晶体管阵列基板
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Application No.: US13180287Application Date: 2011-07-11
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Publication No.: US08305542B2Publication Date: 2012-11-06
- Inventor: Dong Woo Kang , Soung Yeoul Eom , Bong Chul Kim , Ki Soub Yang
- Applicant: Dong Woo Kang , Soung Yeoul Eom , Bong Chul Kim , Ki Soub Yang
- Applicant Address: KR Seoul
- Assignee: LG Display Co., Ltd.
- Current Assignee: LG Display Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Brinks Hofer Gilson & Lione
- Priority: KR10-2005-0080149 20050830
- Main IPC: G02F1/1345
- IPC: G02F1/1345

Abstract:
A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.
Public/Granted literature
- US20110287561A1 THIN FILM TRANSISTOR ARRAY SUBSTRATE WITH IMPROVED TEST TERMINALS Public/Granted day:2011-11-24
Information query
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