In a total luminous flux measurement apparatus according to an embodiment, a total luminous flux emitted by an object is calculated based on a result of measuring illuminances using a measuring unit when providing relative movement between the object and an integrating unit to expose a substantially entire light emitting surface of the object to an inner space of the integrating unit. Specifically, under conditions that the object is disposed to penetrate the integrating unit from one sample hole to the other sample hole, a luminous flux of a portion of the object within the inner space of the integrating unit is measured, then the integrating unit is moved relative to the object, and a luminous flux of a portion accordingly contained in the inner space of the integrating unit is measured.