Invention Grant
US08305838B2 Semiconductor memory device for guaranteeing reliability of data transmission and semiconductor system including the same 有权
半导体存储器件,用于保证数据传输的可靠性和包括其的半导体系统

  • Patent Title: Semiconductor memory device for guaranteeing reliability of data transmission and semiconductor system including the same
  • Patent Title (中): 半导体存储器件,用于保证数据传输的可靠性和包括其的半导体系统
  • Application No.: US13243697
    Application Date: 2011-09-23
  • Publication No.: US08305838B2
    Publication Date: 2012-11-06
  • Inventor: Mun-Phil Park
  • Applicant: Mun-Phil Park
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2009-0049391 20090604
  • Main IPC: G11C8/00
  • IPC: G11C8/00
Semiconductor memory device for guaranteeing reliability of data transmission and semiconductor system including the same
Abstract:
A semiconductor device includes a system clock input unit configured to receive a system clock for synchronizing input times of an address signal and a command signal from a memory controller, a data clock input unit configured to receive first and second data clocks for synchronizing an input/output time of a data signal from the memory controller, wherein a phase of the second data clock is shifted according to a training information signal, and the second data clock having the shifted phase is inputted to the data clock input unit, and a phase detection unit configured to detect a logic level of the second data clock based on an edge of the first data clock, and generate the training information signal to transmit the generated signal to the memory controller according to the detected logic level.
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