Invention Grant
- Patent Title: Nitride compound semiconductor element and method for manufacturing same
- Patent Title (中): 氮化物半导体元件及其制造方法
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Application No.: US13234326Application Date: 2011-09-16
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Publication No.: US08306085B2Publication Date: 2012-11-06
- Inventor: Yoshiaki Hasegawa , Toshiya Yokogawa , Atsushi Yamada , Yoshiaki Matsuda
- Applicant: Yoshiaki Hasegawa , Toshiya Yokogawa , Atsushi Yamada , Yoshiaki Matsuda
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Renner, Otto, Boisselle & Sklar, LLP
- Priority: JP2005-371863 20051226
- Main IPC: H01S5/10
- IPC: H01S5/10

Abstract:
The present invention is directed to a production method for a nitride compound semiconductor element including a substrate and a multilayer structure 40 supported by an upper face of the substrate. First, a wafer 1 to be split into individual substrates is provided. A plurality of semiconductor layers composing the multilayer structure 40 are grown on the wafer 1. By cleaving the wafer 1 and the semiconductor layers, a cleavage plane in the multilayer structure 40 is formed. In the present invention, a plurality of voids are arranged at positions in the multilayer structure at which a cleavage plane is to be formed. Thus, cleavage can be performed with a good yield.
Public/Granted literature
- US20120002693A1 NITRIDE COMPOUND SEMICONDUCTOR ELEMENT AND METHOD FOR MANUFACTURING SAME Public/Granted day:2012-01-05
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