Invention Grant
US08306100B2 Test circuit capable of masking data at read operation and method for controlling the same
有权
在读取操作时能够屏蔽数据的测试电路及其控制方法
- Patent Title: Test circuit capable of masking data at read operation and method for controlling the same
- Patent Title (中): 在读取操作时能够屏蔽数据的测试电路及其控制方法
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Application No.: US12177838Application Date: 2008-07-22
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Publication No.: US08306100B2Publication Date: 2012-11-06
- Inventor: Kwang-Su Lee
- Applicant: Kwang-Su Lee
- Applicant Address: KR
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR
- Agency: Baker & McKenzie LLP
- Priority: KR10-2007-0114124 20071109
- Main IPC: H04B17/00
- IPC: H04B17/00
Abstract:
A test circuit capable of reducing the number of data I/O pins of a tester at a read operation includes a data masking control unit for masking a part of output data in response to an activation of one of an upper data masking signal to control a group of upper data pins and a lower data masking signal to control a group of lower data pins when a test mode signal is activated at a read operation.
Public/Granted literature
- US20090122850A1 TEST CIRCUIT CAPABLE OF MASKING DATA AT READ OPERATION AND METHOD FOR CONTROLLING THE SAME Public/Granted day:2009-05-14
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