Invention Grant
- Patent Title: Detection setup for X-ray phase contrast imaging
- Patent Title (中): X射线相位成像检测设置
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Application No.: US12744070Application Date: 2008-11-19
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Publication No.: US08306183B2Publication Date: 2012-11-06
- Inventor: Thomas Koehler
- Applicant: Thomas Koehler
- Applicant Address: NL Eindhoven
- Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee: Koninklijke Philips Electronics N.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP07121478 20071126
- International Application: PCT/IB2008/054852 WO 20081119
- International Announcement: WO2009/069040 WO 20090604
- Main IPC: G01N23/02
- IPC: G01N23/02

Abstract:
The invention relates to a method and a device for generating phase contrast X-ray images of an object (1). The device comprises an X-ray source (10) that may for example be realized by a spatially extended emitter (11) behind a grating (G0). A diffractive optical element (DOE), for example a phase grating (G1), generates an interference pattern (I) from the X-radiation that has passed the object (1), and a spectrally resolving X-ray detector (30) is used to measure this interference pattern behind the DOE. Using the information obtained for different wavelengths/energies of X-radiation, the phase shift induced by the object can be reconstructed.
Public/Granted literature
- US20100272230A1 DETECTION SETUP FOR X-RAY PHASE CONTRAST IMAGING Public/Granted day:2010-10-28
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