Invention Grant
US08306183B2 Detection setup for X-ray phase contrast imaging 有权
X射线相位成像检测设置

  • Patent Title: Detection setup for X-ray phase contrast imaging
  • Patent Title (中): X射线相位成像检测设置
  • Application No.: US12744070
    Application Date: 2008-11-19
  • Publication No.: US08306183B2
    Publication Date: 2012-11-06
  • Inventor: Thomas Koehler
  • Applicant: Thomas Koehler
  • Applicant Address: NL Eindhoven
  • Assignee: Koninklijke Philips Electronics N.V.
  • Current Assignee: Koninklijke Philips Electronics N.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: EP07121478 20071126
  • International Application: PCT/IB2008/054852 WO 20081119
  • International Announcement: WO2009/069040 WO 20090604
  • Main IPC: G01N23/02
  • IPC: G01N23/02
Detection setup for X-ray phase contrast imaging
Abstract:
The invention relates to a method and a device for generating phase contrast X-ray images of an object (1). The device comprises an X-ray source (10) that may for example be realized by a spatially extended emitter (11) behind a grating (G0). A diffractive optical element (DOE), for example a phase grating (G1), generates an interference pattern (I) from the X-radiation that has passed the object (1), and a spectrally resolving X-ray detector (30) is used to measure this interference pattern behind the DOE. Using the information obtained for different wavelengths/energies of X-radiation, the phase shift induced by the object can be reconstructed.
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