Invention Grant
US08306274B2 Methods for estimating peak location on a sampled surface with improved accuracy and applications to image correlation and registration
有权
用于以提高的精度估计采样表面上的峰值位置的方法,以及用于图像相关和注册的方法
- Patent Title: Methods for estimating peak location on a sampled surface with improved accuracy and applications to image correlation and registration
- Patent Title (中): 用于以提高的精度估计采样表面上的峰值位置的方法,以及用于图像相关和注册的方法
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Application No.: US12787289Application Date: 2010-05-25
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Publication No.: US08306274B2Publication Date: 2012-11-06
- Inventor: Thomas J Grycewicz
- Applicant: Thomas J Grycewicz
- Applicant Address: US CA El Segundo
- Assignee: The Aerospace Corporation
- Current Assignee: The Aerospace Corporation
- Current Assignee Address: US CA El Segundo
- Agency: Henricks, Slavin & Holmes LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G21K1/02

Abstract:
Methods and systems for estimating peak location on a sampled surface (e.g., a correlation surface generated from pixilated images) utilize one or more processing techniques to determine multiple peak location estimates for at least one sampled data set at a resolution smaller than the spacing of the data elements. Estimates selected from the multiple peak location estimates are combined (e.g., a group of estimates is combined by determining a weighted average of the estimates selected for the group) to provide one or more refined estimates. In example embodiments, multiple refined estimates are combined to provide an estimate of overall displacement (e.g., of an image or other sampled data representation of an object).
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