Invention Grant
- Patent Title: Component assembly inspection method and component assembly inspection apparatus
- Patent Title (中): 组件组装检验方法和组件组装检验仪器
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Application No.: US12536938Application Date: 2009-08-06
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Publication No.: US08306307B2Publication Date: 2012-11-06
- Inventor: Naoki Koike , Kimihiro Wakabayashi
- Applicant: Naoki Koike , Kimihiro Wakabayashi
- Applicant Address: JP Tokyo
- Assignee: Fuji Xerox Co., Ltd.
- Current Assignee: Fuji Xerox Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2009-074336 20090325
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01C19/00 ; G01C25/00 ; G01D18/00 ; G01F25/00 ; G06F19/00

Abstract:
A component assembly inspection method includes taking an image of a first light spot group possessed by a first component with a camera after the first component is assembled in a second component, the first light spot group including plural light spots. The method further includes recognizing a position and an attitude of the first component based on a light image that is on the image taken with the camera and represents each of the light spots of the first light spot group; and determining quality of an assembly state of the first component in the second component based on the position and attitude of the first component.
Public/Granted literature
- US20100246894A1 COMPONENT ASSEMBLY INSPECTION METHOD AND COMPONENT ASSEMBLY INSPECTION APPARATUS Public/Granted day:2010-09-30
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