Invention Grant
- Patent Title: Method for optically detecting surface defect of round wire rod
- Patent Title (中): 光线检测圆线棒表面缺陷的方法
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Application No.: US12675405Application Date: 2008-08-28
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Publication No.: US08306308B2Publication Date: 2012-11-06
- Inventor: Se Ho Choi , Ho Mun Bae , Hwa Won Hwang , Chang Hyun Park
- Applicant: Se Ho Choi , Ho Mun Bae , Hwa Won Hwang , Chang Hyun Park
- Applicant Address: KR Pohang
- Assignee: POSCO
- Current Assignee: POSCO
- Current Assignee Address: KR Pohang
- Agency: The Webb Law Firm
- Priority: KR10-2007-0086464 20070828
- International Application: PCT/KR2008/005052 WO 20080828
- International Announcement: WO2009/028883 WO 20090305
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B11/02 ; G01B11/24 ; G01B11/30

Abstract:
A device and method can optically detect a defect of a round wire rod to be tested, and particularly, remotely detect the defect without contact in real-time. The device includes a lighting device for emitting circular surface light to the round wire rod; an optical sensor for generating an optical signal by receiving the light reflected from the round wire rod, which is being transported, and converting the optical signal into an image signal; and a signal-processing unit for acquiring surface information of the round wire rod by receiving the image signal from the optical sensor.
Public/Granted literature
- US20100246974A1 DEVICE AND METHOD FOR OPTICALLY DETECTING SURFACE DEFECT OF ROUND WIRE ROD Public/Granted day:2010-09-30
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