Invention Grant
- Patent Title: Method of forming an inductor on a semiconductor wafer
- Patent Title (中): 在半导体晶片上形成电感器的方法
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Application No.: US12826365Application Date: 2010-06-29
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Publication No.: US08309452B2Publication Date: 2012-11-13
- Inventor: Yaojian Lin , Haijing Cao , Qing Zhang
- Applicant: Yaojian Lin , Haijing Cao , Qing Zhang
- Applicant Address: SG Singapore
- Assignee: STATS ChipPAC, Ltd.
- Current Assignee: STATS ChipPAC, Ltd.
- Current Assignee Address: SG Singapore
- Agency: Patent Law Group: Atkins & Associates, P.C.
- Agent Robert D. Atkins
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/60

Abstract:
A semiconductor device has a substrate with an inductor formed on its surface. First and second contact pads are formed on the substrate. A passivation layer is formed over the substrate and first and second contact pads. A protective layer is formed over the passivation layer. The protective layer is removed over the first contact pad, but not from the second contact pad. A conductive layer is formed over the first contact pad. The conductive layer is coiled on the surface of the substrate to produce inductive properties. The formation of the conductive layer involves use of a wet etchant. The second contact pad is protected from the wet etchant by the protective layer. The protective layer is removed from the second contact pad after forming the conductive layer over the first contact pad. An external connection is formed on the second contact pad.
Public/Granted literature
- US20100264516A1 Method of Forming an Inductor on a Semiconductor Wafer Public/Granted day:2010-10-21
Information query
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