Invention Grant
- Patent Title: Automatic calibration circuit
- Patent Title (中): 自动校准电路
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Application No.: US12699829Application Date: 2010-02-03
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Publication No.: US08310224B2Publication Date: 2012-11-13
- Inventor: Kiran Karnik
- Applicant: Kiran Karnik
- Applicant Address: US OR Hillsboro
- Assignee: TriQuint Semiconductor, Inc.
- Current Assignee: TriQuint Semiconductor, Inc.
- Current Assignee Address: US OR Hillsboro
- Agency: Schwabe Williamson & Wyatt
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R31/40

Abstract:
Embodiments of circuits, devices, and methods related to calibration circuits are disclosed. In various embodiments, a calibration circuit may be used for calibrating a power detector circuit. In various other embodiments, a calibration circuit may be used for calibrating a resistor module. Other embodiments may also be described and claimed.
Public/Granted literature
- US20110187345A1 AUTOMATIC CALIBRATION CIRCUIT Public/Granted day:2011-08-04
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