Invention Grant
- Patent Title: Method for determining, section after section, a parameter-dependent correction value approximation course and sensor arrangement
- Patent Title (中): 用于确定部分之后的参数相关校正值近似过程和传感器布置的方法
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Application No.: US12678567Application Date: 2008-09-11
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Publication No.: US08311760B2Publication Date: 2012-11-13
- Inventor: Hans-Peter Hohe , Michael Hackner , Markus Stahl-Offergeld
- Applicant: Hans-Peter Hohe , Michael Hackner , Markus Stahl-Offergeld
- Applicant Address: DE Munich
- Assignee: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung e.V.
- Current Assignee: Fraunhofer-Gesellschaft zur Foerderung der Angewandten Forschung e.V.
- Current Assignee Address: DE Munich
- Agency: Keating & Bennett, LLP
- Priority: DE102007044471 20070918
- International Application: PCT/EP2008/007472 WO 20080911
- International Announcement: WO2009/036923 WO 20090326
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
An embodiment of a method for a determination, section after section, of a parameter-dependent correction value approximation course includes determining a first measurement signal value with a first parameter value associated with a sensor arrangement when the first parameter value fullfils a predetermined condition or a trigger condition is fulfilled, changing the first parameter value to obtain a second parameter value, determining a second signal value with the second parameter value and determining a second partial section of the correction value approximation course for a second parameter range based on a functional connection describing the second partial section, the first parameter value, the second parameter value, the first measurement signal value, the second measurement signal value and an initial correction value.
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