Invention Grant
- Patent Title: Integrated micro-electro-mechanical systems (MEMS) sensor device
- Patent Title (中): 集成微机电系统(MEMS)传感器设备
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Application No.: US12477667Application Date: 2009-06-03
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Publication No.: US08315793B2Publication Date: 2012-11-20
- Inventor: Lakshman Withanawasam
- Applicant: Lakshman Withanawasam
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Agency: Fogg & Powers LLC
- Main IPC: G01P15/00
- IPC: G01P15/00 ; G01C9/00 ; G01C21/10

Abstract:
An integrated sensor device is provided. The integrated sensor device comprises a first substrate including a surface portion and a second substrate coupled to the surface portion of the first substrate in a stacked configuration, wherein a cavity is defined between the first substrate and the second substrate. The integrated sensor device also comprises one or more micro-electro-mechanical systems (MEMS) sensors located at least partially in the first substrate, wherein the MEMS sensor communicates with the cavity. The integrated sensor device further comprises one or more additional sensors.
Public/Granted literature
- US20100312468A1 INTEGRATED MICRO-ELECTRO-MECHANICAL SYSTEMS (MEMS) SENSOR DEVICE Public/Granted day:2010-12-09
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