Invention Grant
- Patent Title: Method of reading memory cell
- Patent Title (中): 读取存储单元的方法
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Application No.: US13434881Application Date: 2012-03-30
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Publication No.: US08320201B2Publication Date: 2012-11-27
- Inventor: Amit Kumar Gupta , Devesh Dwivedi , Sanjeev Kumar Jain , Yatender Mishra
- Applicant: Amit Kumar Gupta , Devesh Dwivedi , Sanjeev Kumar Jain , Yatender Mishra
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Priority: IN231/DEL/2009 20090206
- Main IPC: G11C7/22
- IPC: G11C7/22

Abstract:
A method for reading a memory cell (20) of a semiconductor memory (10) includes initiating a precharge or predischarge operation on a bit line (24) prior to arrival of a triggering edge of a clock signal (32) that initiates a read operation. A word line (22) is activated responsive to the triggering edge of the clock signal (32), and data is read from the memory cell (20).
Public/Granted literature
- US20120188837A1 METHOD OF READING MEMORY CELL Public/Granted day:2012-07-26
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