Invention Grant
US08321165B2 Information processing apparatus, voltage acceptance test system, and voltage acceptance test method 有权
信息处理装置,电压验收试验系统和电压验收试验方法

  • Patent Title: Information processing apparatus, voltage acceptance test system, and voltage acceptance test method
  • Patent Title (中): 信息处理装置,电压验收试验系统和电压验收试验方法
  • Application No.: US12555852
    Application Date: 2009-09-09
  • Publication No.: US08321165B2
    Publication Date: 2012-11-27
  • Inventor: Kimihiro Nishiyama
  • Applicant: Kimihiro Nishiyama
  • Applicant Address: JP Kawasaki
  • Assignee: Fujitsu Limited
  • Current Assignee: Fujitsu Limited
  • Current Assignee Address: JP Kawasaki
  • Agency: Fujitsu Patent Center
  • Priority: JP2008-231801 20080910
  • Main IPC: G01R19/00
  • IPC: G01R19/00 G06F11/30
Information processing apparatus, voltage acceptance test system, and voltage acceptance test method
Abstract:
An information processing apparatus including: a test program 2 that acquires a first voltage value which is a voltage value at which a target apparatus operates, allows the target apparatus to operate at the first voltage value, and determines an operating state of the target apparatus; a voltage change controller 12 that changes, in the case where a result of the determination is abnormal state, a voltage value difference which is a difference between a voltage value at the next stage and the first voltage value or a time difference so as to reduce the change rate obtained by dividing the voltage value difference by the time difference and outputs, when a time obtained by adding the time difference to the current time has come, a second voltage value obtained by adding or subtracting to/from the first voltage value to the test program 2 as the first voltage value.
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