Invention Grant
- Patent Title: Information processing apparatus, voltage acceptance test system, and voltage acceptance test method
- Patent Title (中): 信息处理装置,电压验收试验系统和电压验收试验方法
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Application No.: US12555852Application Date: 2009-09-09
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Publication No.: US08321165B2Publication Date: 2012-11-27
- Inventor: Kimihiro Nishiyama
- Applicant: Kimihiro Nishiyama
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2008-231801 20080910
- Main IPC: G01R19/00
- IPC: G01R19/00 ; G06F11/30

Abstract:
An information processing apparatus including: a test program 2 that acquires a first voltage value which is a voltage value at which a target apparatus operates, allows the target apparatus to operate at the first voltage value, and determines an operating state of the target apparatus; a voltage change controller 12 that changes, in the case where a result of the determination is abnormal state, a voltage value difference which is a difference between a voltage value at the next stage and the first voltage value or a time difference so as to reduce the change rate obtained by dividing the voltage value difference by the time difference and outputs, when a time obtained by adding the time difference to the current time has come, a second voltage value obtained by adding or subtracting to/from the first voltage value to the test program 2 as the first voltage value.
Public/Granted literature
- US20100063759A1 INFORMATION PROCESSING APPARATUS, VOLTAGE ACCEPTANCE TEST SYSTEM, AND VOLTAGE ACCEPTANCE TEST METHOD Public/Granted day:2010-03-11
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