Invention Grant
- Patent Title: Mass spectrometer and mass spectrometry method
- Patent Title (中): 质谱仪和质谱法
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Application No.: US12794665Application Date: 2010-06-04
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Publication No.: US08324568B2Publication Date: 2012-12-04
- Inventor: Yoshiro Shiokawa , Yoshiki Hirano , Megumi Nakamura , Yasuyuki Taneda , Qiang Peng , Harumi Maruyama
- Applicant: Yoshiro Shiokawa , Yoshiki Hirano , Megumi Nakamura , Yasuyuki Taneda , Qiang Peng , Harumi Maruyama
- Applicant Address: JP Kanagawa-Ken
- Assignee: Canon Anelva Corporation
- Current Assignee: Canon Anelva Corporation
- Current Assignee Address: JP Kanagawa-Ken
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2008-253915 20080930
- Main IPC: H01J49/26
- IPC: H01J49/26

Abstract:
A mass spectrometer includes an ionization chamber (100) which generates fragment-free ions to be detected from an introduced gas to be detected, and a mass spectrometer chamber (140) including a mass spectrometer (160) which fractionates by mass the ions to be detected that are transported from the ionization chamber and which detects the ions. The mass spectrometer further includes a probe (111) which holds a liquid sample or a solid sample and causes the liquid sample or the solid sample to generate the gas to be detected upon heating by a heating means, and a gas introduction means (170) which introduces a predetermined gas from the probe to the ionization chamber to transport, to the ionization chamber, the gas to be detected that is generated at the probe.
Public/Granted literature
- US20100243884A1 MASS SPECTROMETER AND MASS SPECTROMETRY METHOD Public/Granted day:2010-09-30
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