Invention Grant
- Patent Title: Output apparatus and test apparatus
- Patent Title (中): 输出装置和试验装置
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Application No.: US13154418Application Date: 2011-06-06
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Publication No.: US08324947B2Publication Date: 2012-12-04
- Inventor: Hiroki Ichikawa
- Applicant: Hiroki Ichikawa
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ryuka
- Priority: JP2009-035847 20090218
- Main IPC: H03K3/00
- IPC: H03K3/00 ; H03K5/12

Abstract:
Provided is an output apparatus that outputs an output signal corresponding to an input signal, comprising a plurality of drivers that each output an intermediate signal having a waveform corresponding to the input signal; an adding section that adds together the intermediate signals output from the drivers and outputs the result as the output signal; and a control section that controls a difference in delay amount, which is from when the input signal begins to change to when the intermediate signal begins to change, among the drivers according to a designated slew rate.
Public/Granted literature
- US20110298522A1 OUTPUT APPARATUS AND TEST APPARATUS Public/Granted day:2011-12-08
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