Invention Grant
- Patent Title: Optical density determination methods and apparatus
- Patent Title (中): 光密度测定方法和装置
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Application No.: US12642562Application Date: 2009-12-18
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Publication No.: US08325344B2Publication Date: 2012-12-04
- Inventor: Michael H. Lee , Daihua Zhang , Omer Gila , William D. Holland
- Applicant: Michael H. Lee , Daihua Zhang , Omer Gila , William D. Holland
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
At least some aspects of the disclosure are directed towards densitometers and methods of determining optical density of printed images upon media. According to one example, an optical density determination apparatus includes a first light source configured to emit a first light beam in a first direction towards a substrate; a second light source configured to emit a second light beam in a second direction towards the substrate, the second direction being different than the first direction; a first sensor configured to sense light of the first light beam reflected from the substrate; a second sensor configured to sense light of the second light beam reflected from the substrate; and wherein the first and second sensors are configured to provide signals indicative of the light sensed by the first and second sensors and which are useable to determine optical density of the substrate.
Public/Granted literature
- US20110149284A1 OPTICAL DENSITY DETERMINATION METHODS AND APPARATUS Public/Granted day:2011-06-23
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