Invention Grant
- Patent Title: X-ray imaging apparatus
- Patent Title (中): X射线成像装置
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Application No.: US12863180Application Date: 2009-01-15
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Publication No.: US08325876B2Publication Date: 2012-12-04
- Inventor: Tae Woo Kim
- Applicant: Tae Woo Kim
- Applicant Address: KR Gyeonggi-Do KR Gyeonggi-Do
- Assignee: Vatech Ewoo Holdings, Co., Ltd.,Rayence Co., Ltd.
- Current Assignee: Vatech Ewoo Holdings, Co., Ltd.,Rayence Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do KR Gyeonggi-Do
- Agency: Park Law Firm
- Agent John K. Park
- Priority: KR10-2008-0004570 20080115
- International Application: PCT/KR2009/000233 WO 20090115
- International Announcement: WO2009/091204 WO 20090723
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
The present invention relates to an X-ray imaging apparatus comprising an X-ray source unit generating an X-ray, an X-ray detecting sensor unit having a sensor panel equipped with multiple sensors detecting the X-ray which is generated from the X-ray source unit and passed through an object, and a panel-moving means mounted on the X-ray detecting sensor unit and moving the sensor panel. Thus, employing and butting multiple small X-ray sensors instead of expensive large sensors advantageously reduces the manufacturing cost for the X-ray imaging apparatus, and enables the imaging of the same wide area as with the use of the large sensors.
Public/Granted literature
- US20110044428A1 X-RAY IMAGING APPARATUS Public/Granted day:2011-02-24
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