Invention Grant
- Patent Title: Measurement apparatus and control method
- Patent Title (中): 测量装置及控制方法
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Application No.: US12108078Application Date: 2008-04-23
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Publication No.: US08326021B2Publication Date: 2012-12-04
- Inventor: Kazuhiko Kobayashi , Shinji Uchiyama
- Applicant: Kazuhiko Kobayashi , Shinji Uchiyama
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Cowan, Liebowitz & Latman, PC
- Priority: JP2007-117563 20070426
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A measurement apparatus (100), which measures the relative position and orientation of an image-capturing apparatus (50) capturing images of one or more measurement objects (10) with respect to the measurement object, acquires a captured image using the image-capturing apparatus (50). Moreover, the respective geometric features present in a 3D model of the measurement object (10) are projected onto the captured image based on the position and orientation of the image-capturing apparatus (50), thereby obtaining projection geometric features. Projection geometric features to be used in calculation of the position and orientation are then selected from the resultant projection geometric features based on distances between the projection geometric features in the captured image. The relative position and orientation of the image-capturing apparatus (50) with respect to the measurement object is then calculated using the selected projection geometric features and image geometric features corresponding to the selected projection geometric features detected in the captured image.
Public/Granted literature
- US20080267454A1 MEASUREMENT APPARATUS AND CONTROL METHOD Public/Granted day:2008-10-30
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