Invention Grant
- Patent Title: Measurement apparatus
- Patent Title (中): 测量装置
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Application No.: US12556670Application Date: 2009-09-10
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Publication No.: US08326567B2Publication Date: 2012-12-04
- Inventor: Takahiro Masumura
- Applicant: Takahiro Masumura
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2008-237253 20080917
- Main IPC: G06M7/02
- IPC: G06M7/02 ; G06M7/08 ; G01N30/16 ; G01N30/18

Abstract:
A measurement apparatus includes an elastic detector configured to detect an elastic wave by utilizing photoacoustic tomography and to convert the elastic wave into a detection signal, and a signal processor configured to calculate an absorption characteristic of a heterogeneous part included in a homogeneous part of a scattering medium based on μa=2P(z)/(ΓΦ(z)) where μa is the absorption coefficient at distance z from the light source, P(z) is the pressure of the elastic wave at distance z, Γ is a Grüneisen coefficient, and Φ(z) is the light intensity at the position of the heterogeneous part, the signal processor obtaining the light intensity by approximating a signal component derived from the homogeneous part separated from a signal component derived from the heterogeneous part in the scattering medium by utilizing the detection signal output from the elastic wave detector.
Public/Granted literature
- US20100070233A1 MEASUREMENT APPARATUS Public/Granted day:2010-03-18
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