Invention Grant
US08327238B2 Erased sector detection mechanisms 有权
擦除扇区检测机制

Erased sector detection mechanisms
Abstract:
The present invention presents a non-volatile memory and method for its operation that allows instant and accurate detection of erased sectors when the sectors contain a low number of zero bits, due to malfunctioning cells or other problems, and the sector can still be used as the number of corrupted bits is under the ECC correction limit. This method allows the storage system to become tolerant to erased sectors corruption, as such sectors can be used for further data storage if the system can correct this error later in the written data by ECC correction.
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