Invention Grant
- Patent Title: Erased sector detection mechanisms
- Patent Title (中): 擦除扇区检测机制
-
Application No.: US12208054Application Date: 2008-09-10
-
Publication No.: US08327238B2Publication Date: 2012-12-04
- Inventor: Sergey Anatolievich Gorobets
- Applicant: Sergey Anatolievich Gorobets
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Davis Wright Tremaine LLP
- Main IPC: H03M13/00
- IPC: H03M13/00

Abstract:
The present invention presents a non-volatile memory and method for its operation that allows instant and accurate detection of erased sectors when the sectors contain a low number of zero bits, due to malfunctioning cells or other problems, and the sector can still be used as the number of corrupted bits is under the ECC correction limit. This method allows the storage system to become tolerant to erased sectors corruption, as such sectors can be used for further data storage if the system can correct this error later in the written data by ECC correction.
Public/Granted literature
- US20090006929A1 Erased Sector Detection Mechanisms Public/Granted day:2009-01-01
Information query
IPC分类: