Invention Grant
- Patent Title: Overlay identification of data processing target structure
- Patent Title (中): 数据处理目标结构的覆盖识别
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Application No.: US12354740Application Date: 2009-01-15
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Publication No.: US08327338B2Publication Date: 2012-12-04
- Inventor: Herman Aranguren , David Bruce LeGendre , David Charles Reed , Max Douglas Smith
- Applicant: Herman Aranguren , David Bruce LeGendre , David Charles Reed , Max Douglas Smith
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Griffiths & Seaton PLLC
- Main IPC: G06F9/44
- IPC: G06F9/44 ; G06F11/00

Abstract:
A method, system, and computer program product for identifying an overlay of a data processing target structure in a computing environment is provided. At least one of examining a mapping macro for the target structure with a set of valid ranges, comparing the set of valid ranges with the target structure to identify a string of at least one first invalid value and a last invalid value and locate invalid regions of the target structure, and examining executable code associated with the target structure, comparing at least one unchanged module against at least one additional module exhibiting an overlay characteristic to identify the string of the at least one first invalid value and the last invalid value and locate invalid regions of the target structure, is performed.
Public/Granted literature
- US20100180262A1 OVERLAY IDENTIFICATION OF DATA PROCESSING TARGET STRUCTURE Public/Granted day:2010-07-15
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