Invention Grant
- Patent Title: Foreign substance inspection apparatus, exposure apparatus, and method of manufacturing device
- Patent Title (中): 异物检查装置,曝光装置及其制造方法
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Application No.: US12871368Application Date: 2010-08-30
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Publication No.: US08330949B2Publication Date: 2012-12-11
- Inventor: Atsushi Kawahara
- Applicant: Atsushi Kawahara
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2009-201084 20090831
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N15/02

Abstract:
A foreign substance inspection apparatus includes a light projecting unit, a detector which detects the intensity of scattered light of light projected onto the surface of an object to be detected by the light projecting unit, in association with the two-dimensional coordinate position on the surface, and a processing unit. The relationship between the intensity of the scattered light detected by the detector and the particle size of the foreign substance differs depending on the two-dimensional coordinate position on the surface. The processing unit determines, a conversion curve to convert the intensity of the scattered light detected by the detector into the particle size of the foreign substance, in accordance with the two-dimensional coordinate position of the foreign substance detected by the detector, and converts the intensity of the scattered light detected by the detector into the particle size of the foreign substance using the determined conversion curve.
Public/Granted literature
- US20110051130A1 FOREIGN SUBSTANCE INSPECTION APPARATUS, EXPOSURE APPARATUS, AND METHOD OF MANUFACTURING DEVICE Public/Granted day:2011-03-03
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