Invention Grant
- Patent Title: Cooling apparatus for semiconductor element
- Patent Title (中): 半导体元件冷却装置
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Application No.: US12943417Application Date: 2010-11-10
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Publication No.: US08331092B2Publication Date: 2012-12-11
- Inventor: Masanori Kawaura , Hirohito Matsui , Tadafumi Yoshida
- Applicant: Masanori Kawaura , Hirohito Matsui , Tadafumi Yoshida
- Applicant Address: JP Aichi-ken JP Aichi
- Assignee: Toyota Jidosha Kabushiki Kaisha,Nippon Soken, Inc
- Current Assignee: Toyota Jidosha Kabushiki Kaisha,Nippon Soken, Inc
- Current Assignee Address: JP Aichi-ken JP Aichi
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-258986 20091112
- Main IPC: H05K7/20
- IPC: H05K7/20 ; F28D7/00 ; H01L23/34

Abstract:
A semiconductor element cooling apparatus includes: a first member whose first surface on which a semiconductor element is mounted, and whose second surface has fins that define coolant flow paths, and that extend in a first direction, and that stand from the second surface to a predetermined height, and that are spaced from each other by predetermined intervals; and a second member that defines the coolant flow paths that extend in the first direction. The fins have grooves which extend in a second direction that intersects the first direction, and which have a depth that extends from the distal end side of the fins toward the second surface. The depth of the grooves is smaller than the height of the fins. A protrusion-forming member is disposed in the grooves, and extends across adjacent fins, and forms protrusions in the coolant flow paths defined by the adjacent fins.
Public/Granted literature
- US20110108247A1 COOLING APPARATUS FOR SEMICONDUCTOR ELEMENT Public/Granted day:2011-05-12
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