Invention Grant
US08331132B2 Adaptive write bit line and word line adjusting mechanism for memory
有权
适应性写入位线和字线调整机制用于存储器
- Patent Title: Adaptive write bit line and word line adjusting mechanism for memory
- Patent Title (中): 适应性写入位线和字线调整机制用于存储器
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Application No.: US12849570Application Date: 2010-08-03
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Publication No.: US08331132B2Publication Date: 2012-12-11
- Inventor: Hank Cheng , Ming-Zhang Kuo , Chung-Cheng Chou
- Applicant: Hank Cheng , Ming-Zhang Kuo , Chung-Cheng Chou
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham & Berner, LLP
- Main IPC: G11C11/24
- IPC: G11C11/24 ; G11C7/00 ; G11C8/00

Abstract:
A memory includes a capacitor coupled to a write bit line or a word line. An initializer is configured to initialize a voltage level at a first node between the capacitor and the write bit line or a word line. An initial level adjuster is configured to adjust a voltage level of a second node at one terminal of the capacitor. A pulse generator configured to supply a pulse to the initial level adjuster to control the initial level adjuster. A boost signal is configured to be supplied to a third node on the other terminal of the capacitor opposite the first node to boost a voltage level of the write bit line lower than ground or to boost a voltage level of the word line higher than a power supply voltage.
Public/Granted literature
- US20120033517A1 ADAPTIVE WRITE BIT LINE AND WORD LINE ADJUSTING MECHANISM FOR MEMORY Public/Granted day:2012-02-09
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