Invention Grant
- Patent Title: Correction factors for electromagnetic measurements made through conductive material
- Patent Title (中): 通过导电材料进行电磁测量的校正因子
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Application No.: US12641994Application Date: 2009-12-18
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Publication No.: US08332191B2Publication Date: 2012-12-11
- Inventor: Richard A. Rosthal , Hong Zhang , Cyrille Levesque , Guozhong Gao , H. Frank Morrison , David Alumbaugh
- Applicant: Richard A. Rosthal , Hong Zhang , Cyrille Levesque , Guozhong Gao , H. Frank Morrison , David Alumbaugh
- Applicant Address: US TX Sugar Land
- Assignee: Schlumberger Technology Corporation
- Current Assignee: Schlumberger Technology Corporation
- Current Assignee Address: US TX Sugar Land
- Agent Jeremy Berman; Darla Fonseca
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F7/60 ; G06G7/48 ; G01F3/00 ; G01V1/40 ; G01V3/08

Abstract:
The present disclosure relates to determining attenuation factors relating to an electromagnetic signal passing through, a conductive material seen by a real sensor. A sensor is provided and disposed proximate to the material. An alternating current is passed through the sensor and the impedance of the sensor is measured. The impedance of an ideal coil is obtained from the measured impedance using electromagnetic modeling combined with a circuit analysis of the coil impedance, and the attenuation factors for the real coil in straight or feedback mode are determined by electromagnetic modeling of casing attenuation factors and impedance of an ideal coil combined with equivalent circuit modeling of the sensor transfer functions. The attenuation factors seen by the real sensor may be determined in real-time or post-survey. The material may be magnetic or non-magnetic.
Public/Granted literature
- US20110012620A1 CORRECTION FACTORS FOR ELECTROMAGNETIC MEASUREMENTS MADE THROUGH CONDUCTIVE MATERIAL Public/Granted day:2011-01-20
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