Invention Grant
- Patent Title: Optical angle of arrival measurement system and method
- Patent Title (中): 光学入射角测量系统及方法
-
Application No.: US12401027Application Date: 2009-03-10
-
Publication No.: US08334499B2Publication Date: 2012-12-18
- Inventor: Jian Ma , Bruce K. Winker
- Applicant: Jian Ma , Bruce K. Winker
- Applicant Address: US CA Thousand Oaks
- Assignee: Teledyne Scientific & Imaging, LLC
- Current Assignee: Teledyne Scientific & Imaging, LLC
- Current Assignee Address: US CA Thousand Oaks
- Agency: Koppel, Patrick, Heybl & Philpott
- Main IPC: H01J3/14
- IPC: H01J3/14 ; G01C21/02 ; G01B11/14

Abstract:
An optical angle of arrival measurement system uses an optical element to form at least one narrow width line on a focal plane array (FPA) which is oblique with respect to the FPA's row and column axes and which traverses at least two rows or columns along its length; forming two perpendicular narrow width lines in a cross-pattern is preferred. Interpolating the position of the lines on the FPA provides coordinates that can be used to calculate the optical angle of arrival in accordance with θx=A(x)·tan−1(x/f), and θy=B(y)·tan−1(y/f), where f is the focal length of the optical element, and A(x) and B(y) are parameters that account for optical distortion and other imperfections of the system. The resolution δθ of the angle of arrival measurement can be improved to at least δθ˜(d/n)/f, where d is the FPA pixel width and n is the length in pixels of the imaged line.
Public/Granted literature
- US20100230577A1 OPTICAL ANGLE OF ARRIVAL MEASUREMENT SYSTEM AND METHOD Public/Granted day:2010-09-16
Information query